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It is widely recognized that
process variation is emerging as a fundamental challenge to IC design in scaled
CMOS technology; and it will have profound impact on nearly all aspects of
circuit performance. While some of the negative effects of variability can
be handled with improvements in the manufacturing process, the industry is
starting to accept the fact that some of the effects are better mitigated
during the design process. Handling variability in the design process will
require accurate and appropriate models of variability and its dependence
on designable parameters (i.e. layout), and its spatial and temporal
distributions. It also requires carefully designed test structures and
proper statistical data analysis methods to extract meaningful models from
large volumes of silicon measurements. The resulting compact modeling of
systematic, random, spatial, and temporal variations is essential to
abstract the physical level variations into a format the designers (and
more importantly, the tools they use) can utilize. This workshop provides a
forum to discuss current practice as well as near future research needs in
test structure design, variability characterization, compact variability
modeling, and statistical simulation.
Key Topics
Physics mechanisms and technology trends of device-level variations
First-principles simulation methods for predicting variability
Time-dependent variation and their interaction with other variation sources
Compact modeling of variations in devices and interconnect
Device and circuit level modeling techniques
Test structure design for variability
Design interface with manufacturing and solutions for variability
Variability characterization, bounding and extraction
Statistical data analysis and model extraction methods
Novel implementation and simulation techniques for dealing with variability
Tentative Agenda
8:50 9:00am Opening Remarks
Session 1:
Variability in Emerging Technologie
9:00
9:30am Keynote: Krishnendu Chakrabarty (Duke University)
Understanding and Coping with Variabilities in Fabrication, Biochemistry, and Sensing for Microfluidic Biochips
9:30 10:00am Subhasish Mitra (Stanford University)
Carbon Nanotube Digital VLSI: Imperfections and Variations
10:00 10:30am
Morning Break/Discussion
Session 2:
Approximate Computing
10:30 11:00am
Rasit O. Topaloglu (IBM)
Technology Implications on Approximate Computing
11:00 11:30am
Rakesh Kumar (UIUC)
Computing with Reliable Algorithms and Unreliable Memories
11:30 12:00pm
Kaushik Roy and Anand Raghunathan (Purdue)
Approximate Computing for Energy-efficient Error-resilient Multimedia Systems
12:00 1:10pm
Lunch
Session 3: Modeling and Characterization
1:10 1:40pm Keynote:
Toshiro Hiramoto (Univ. of Tokyo)
Variability of 11 Billion Scaled Transistors:
Measurements, Analysis, and Suppression
1:40 2:10pm Chris Kim (Univ. of Minnesota)
In-Situ Monitoring of Circuit Reliability Effects
2:10 2:40pm
A.K.M. Mahfuzul Islam (Kyoto Univ.)
Area-efficient Sensors for On-chip Monitoring of Process, Leakage and
Temperature Variation
2:40 3:10pm Afternoon Break/Discussion
3:10 4:00pm Poster Presentations (3 minutes overview for each poster)
4:00 5:00pm Poster Session
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